Improved electron-beam ion-trap lifetime measurement of the Ne8+1s2s3S1 level

E. Träbert, P. Beiersdorfer, G. V. Brown, A. J. Smith, S. B. Utter, M. F. Gu, and D. W. Savin
Phys. Rev. A 60, 2034 – Published 1 September 1999
PDFExport Citation

Abstract

An earlier electron-beam ion-trap (EBIT) lifetime measurement of the Ne8+1s2s3S1 level has been improved upon, reducing the uncertainties to less than the scatter in the existing theoretical calculations. The new result, 91.7±0.4μs, agrees with the previous value, but is more precise by a factor of 4. The new value distinguishes among theoretical values, as agreement is obtained only with those calculations that employ “exact” nonrelativistic or relativistic wave functions. Routes to measurements with even higher accuracy are discussed.

  • Received 15 March 1999

DOI:https://doi.org/10.1103/PhysRevA.60.2034

©1999 American Physical Society

Authors & Affiliations

E. Träbert*, P. Beiersdorfer, G. V. Brown, A. J. Smith, and S. B. Utter

  • Department of Physics and Space Technology, Lawrence Livermore National Laboratory, Livermore, California 94551

M. F. Gu and D. W. Savin

  • Department of Physics and Columbia Astrophysics Laboratory, Columbia University, New York, New York 10027

  • *Permanent address: Experimentalphysik III, Ruhr-Universität Bochum, D-44780 Bochum, Germany. Electronic address: Traebert@ep3.ruhr-uni-bochum.de
  • Permanent address: Department of Physics, Morehouse College, Atlanta, GA 30314.

References (Subscription Required)

Click to Expand
Issue

Vol. 60, Iss. 3 — September 1999

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review A

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×