Tungsten spectroscopy in the EUV range observed at a high-temperature superconducting electron-beam ion trap

Wenxian Li, Zhan Shi, Yang Yang, Jun Xiao, Tomas Brage, Roger Hutton, and Yaming Zou
Phys. Rev. A 91, 062501 – Published 2 June 2015

Abstract

We have recorded extreme ultraviolet spectra from W11+ to W15+ ions using a flat-field spectrometer installed at the Shanghai high-temperature superconducting electron-beam ion trap. The spectra were recorded at beam energies ranging between 200 and 400 eV and showed spectral lines and transition arrays in the 170–260 Å region. The charge states and spectra transitions were identified by comparison with calculations using a detailed relativistic configuration interaction method and collisional-radiative model, both incorporated in the flexible atomic code. Atomic structure calculations showed that the dominant emission arises from 5d 5p and 5p 5s transitions. The work also identified the ground-state configuration of W13+ as 4f135s2 both theoretically and experimentally.

  • Figure
  • Figure
  • Figure
  • Received 17 March 2015

DOI:https://doi.org/10.1103/PhysRevA.91.062501

©2015 American Physical Society

Authors & Affiliations

Wenxian Li1,2, Zhan Shi3, Yang Yang1,2, Jun Xiao1,2, Tomas Brage3, Roger Hutton1,2,*, and Yaming Zou1,2

  • 1The Key Laboratory of Applied Ion Beam Physics, Ministry of Education, 200433 China
  • 2Shanghai EBIT laboratory, Institute of Modern Physics, Fudan University, Shanghai, 200433 China
  • 3Division of Mathematical Physics, Department of Physics, Lund University, S-22100 Sweden

  • *rhutton@fudan.edu.cn

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 91, Iss. 6 — June 2015

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review A

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×