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Microstructure and optical properties of free-standing porous silicon films: Size dependence of absorption spectra in Si nanometer-sized crystallites

Yoshihiko Kanemitsu, Hiroshi Uto, Yasuaki Masumoto, Takahiro Matsumoto, Toshiro Futagi, and Hidenori Mimura
Phys. Rev. B 48, 2827(R) – Published 15 July 1993
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Abstract

We have studied the microstructure and optical properties of free-standing porous Si thin films fabricated by electrochemical anodization. Raman-spectroscopy and transmission-electron-microscopy examinations show that Si crystallite spheres with diameters of several nanometers are dispersed in the amorphous phase. The blueshift of the optical-absorption spectrum is observed for decreasing average diameter of the Si crystallites. However, there is no clear size dependence of the peak energy of the broad photoluminescence (PL) spectrum. Spectroscopic analysis strongly suggests that the photogeneration of carriers occurs in the c-Si core, whose band gap is modified by the quantum-confinement effect, while the strong PL comes from the near-surface region of small crystallites.

  • Received 1 June 1993

DOI:https://doi.org/10.1103/PhysRevB.48.2827

©1993 American Physical Society

Authors & Affiliations

Yoshihiko Kanemitsu, Hiroshi Uto, and Yasuaki Masumoto

  • Institute of Physics, University of Tsukuba, Tsukuba, Ibaraki 305, Japan

Takahiro Matsumoto, Toshiro Futagi, and Hidenori Mimura

  • Electronics Research Laboratories, Nippon Steel Corporation, Sagamihara, Kanagawa 229, Japan

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Vol. 48, Iss. 4 — 15 July 1993

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