Superparamagnetism and magnetic properties of Ni nanoparticles embedded in SiO2

F. C. Fonseca, G. F. Goya, R. F. Jardim, R. Muccillo, N. L. V. Carreño, E. Longo, and E. R. Leite
Phys. Rev. B 66, 104406 – Published 6 September 2002
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Abstract

We have performed a detailed characterization of the magnetic properties of Ni nanoparticles embedded in a SiO2 amorphous matrix. A modified sol-gel method was employed which resulted in Ni particles with average radius 3nm, as inferred by TEM analysis. Above the blocking temperature TB20K for the most diluted sample, magnetization data show the expected scaling of the M/MS vs H/T curves for superparamagnetic particles. The hysteresis loops were found to be symmetric about zero field axis with no shift via exchange bias, suggesting that Ni particles are free from an oxide layer. For T<TB the magnetic behavior of these Ni nanoparticles is in excellent agreement with the predictions of randomly oriented and noninteracting magnetic particles, as suggested by the temperature dependence of the coercivity field that obeys the relation HC(T)=HC0[1(T/TB)1/2] below TB with HC0780Oe. The obtained values of HC0, considering the temperature dependence of the magnetic anisotropy constant, are discussed within the scenario of isolated randomly oriented and noninteracting single-domain particles.

  • Received 4 March 2002

DOI:https://doi.org/10.1103/PhysRevB.66.104406

©2002 American Physical Society

Authors & Affiliations

F. C. Fonseca, G. F. Goya, and R. F. Jardim*

  • Instituto de Física, Universidade de São Paulo, CP 66318, 05315-970, São Paulo, SP, Brazil

R. Muccillo

  • Centro Multidisciplinar de Desenvolvimento de Materiais Cerâmicos CMDMC, CCTM-Instituto de Pesquisas Energéticas e Nucleares, CP 11049, 05422-970, São Paulo, SP, Brazil

N. L. V. Carreño, E. Longo, and E. R. Leite

  • Centro Multidisciplinar de Desenvolvimento de Materiais Cerâmicos CMDMC, Departamento de Química, Universidade Federal de São Carlos, CP 676, 13560-905, São Carlos, SP, Brazil

  • *Electronic address: rjardim@if.usp.br

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Vol. 66, Iss. 10 — 1 September 2002

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