Abstract
Light-emitting silicon nanocrystals embedded in have been investigated by x-ray absorption measurements in total electron and photoluminescence yields, by energy filtered transmission electron microscopy and by ab initio total energy calculations. Both experimental and theoretical results show that the interface between the silicon nanocrystals and the surrounding is not sharp: an intermediate region of amorphous nature and variable composition links the crystalline Si with the amorphous stoichiometric This region plays an active role in the light-emission process.
- Received 30 May 2003
DOI:https://doi.org/10.1103/PhysRevB.68.085327
©2003 American Physical Society
