New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure

Dale E. Sayers; Edward A. Stern; Farrel W. Lytle

doi:10.1103/PhysRevLett.27.1204

New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure

Dale E. Sayers, Edward A. Stern, and Farrel W. Lytle

Phys. Rev. Lett. 27, 1204 – Published 1 November 1971

Abstract

We have applied Fourier analysis to our point-scattering theory of x-ray absorption fine structure to invert experimental data formally into a radial structure function with determinable structural parameters of distance from the absorbing atom, number of atoms, and widths of coordination shells. The technique is illustrated with a comparison of evaporated and crystalline Ge. We find that the first and second neighbors in amorphous Ge are at the crystalline distance within the accuracy of measurement (1%).

Received 16 July 1971

DOI:https://doi.org/10.1103/PhysRevLett.27.1204

Authors & Affiliations

Dale E. Sayers^* and Edward A. Stern^*,†

Department of Physics, University of Washington, Seattle, Washington 98105

Farrel W. Lytle

Boeing Scientific Research Laboratories, Seattle, Washington 98124

^*Research supported in part by the U. S. Air Force Office of Scientific Research, Office of Aerospace Research.
^†Presently on sabbatical leave at the Physics Department, Technion, Haifa, Israel. Research supported in part by a National Science Foundation Senior Postdoctoral Fellowship.