Measurement of Surface Plasmon Dispersion in Aluminum and Indium

K. J. Krane and H. Raether
Phys. Rev. Lett. 37, 1355 – Published 15 November 1976
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Abstract

Energy-loss experiments with 50-keV electrons on thin polycrystalline films of Al and In yielded data for the surface plasmon dispersion up to k=0.47 and 0.42 Å1, respectively. The wave-vector dependence of the surface plasmon frequency of Al shows a significant increase for k>0.3 Å1, while in the case of In there is only a weak increase for k>0.2 Å1.

  • Received 21 July 1976

DOI:https://doi.org/10.1103/PhysRevLett.37.1355

©1976 American Physical Society

Authors & Affiliations

K. J. Krane and H. Raether

  • Institute of Applied Physics, University of Hamburg, 2000 Hamburg 36, Germany

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Issue

Vol. 37, Iss. 20 — 15 November 1976

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