Abstract
The photoluminescence excitation technique is used to monitor the absorption characteristics of Si nanocrystals. Contributions from different critical points are identified, and their shift with reduced size is deduced. The enhancement of the oscillator strength of the indirect optical transitions due to the confinement is estimated.
- Received 6 February 1996
DOI:https://doi.org/10.1103/PhysRevLett.77.763
©1996 American Physical Society