Abstract
Concentrations of defects in amorphous created by implantation of 10 MeV protons were examined. The depth profile of Si-Si bonds, centers, or peroxy radicals (PORs) was close to that of electronic energy loss. Interstitial molecules were identified and their concentration was larger than that of PORs. The total concentration of the Si-Si bonds and centers was comparable to that of the interstitial and PORs. These results provide experimental evidence that Frenkel defect formation of an oxygen occurs in amorphous by dense electronic excitation. The efficiency of the Frenkel defect formation was estimated as .
- Received 15 August 1997
DOI:https://doi.org/10.1103/PhysRevLett.80.317
©1998 American Physical Society