Residual Native Shallow Donor in ZnO

D. C. Look, J. W. Hemsky, and J. R. Sizelove
Phys. Rev. Lett. 82, 2552 – Published 22 March 1999
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Abstract

High-energy electron irradiation in ZnO produces shallow donors at about EC30meV. Because the production rate is much higher for Zn-face (0001) than O-face (0001¯) irradiation, the donor is identified as a Zn-sublattice defect, most likely the interstitial ZnI or a ZnI-related complex. The donor energy is quite close to that of the unirradiated sample, and of other samples discussed in the literature, strongly suggesting that ZnI (and not VO) is the dominant native shallow donor in ZnO. An exceptionally high displacement threshold energy (1.6MeV) is quantitatively explained in terms of a multiple-displacement model.

  • Received 9 November 1998

DOI:https://doi.org/10.1103/PhysRevLett.82.2552

©1999 American Physical Society

Authors & Affiliations

D. C. Look and J. W. Hemsky

  • Semiconductor Research Center, Wright State University, Dayton, Ohio 45435

J. R. Sizelove

  • Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio 45433

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Vol. 82, Iss. 12 — 22 March 1999

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