We discuss how threshold detectors can be used for a direct measurement of the full distribution of current fluctuations and how to exploit Josephson junctions in this respect. We propose a scheme to characterize the full counting statistics from the current dependence of the escape rate measured. We illustrate the scheme with explicit results for tunnel, diffusive, and quasiballistic mesoscopic conductors.

• Received 15 August 2003

DOI:https://doi.org/10.1103/PhysRevLett.93.106801