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An analysis of the intensity errors from imperfectly spherical crystals with an inhomogeneous incident X- ray beam is presented. The crystals are considered to have either no absorption or strong absorption. The inhomogeneity of the incident beam profile is represented by three possible models: (a) a Lorentzian, (b) a Gaussian and (c) a second-order Taylor series expansion. The results are compared with intensities for electron density studies from five crystals.
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